Thao To is an experienced electrical engineer with a Bachelor of Science in Electrical and Electronics Engineering from Texas A&M University. From January 2000 to September 2012, Thao worked as an Electrical Test Engineer at Texas Instruments, where responsibilities included planning and supporting product development and conducting functionality and verification tests. Thao served as a Production Engineer at Powell from December 2012 to October 2017, designing medium voltage switchgear and utilizing AutoCAD for technical drawings. Since October 2017, Thao has been a Senior Failure Analysis Engineer at Samsung Electronics, specializing in 14nm FinFET technology and performing failure analysis to enhance yield.
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