Yanfeng Du is a Professor at the Shanghai Advanced Research Institute, Chinese Academy of Science, where they conduct research in medical imaging technology. Previously, Yanfeng served as a Senior Physicist at GE Global Research, leading projects in SPECT detector development and industrial volumetric CT systems. They began their academic path as a Research Assistant at the University of Michigan, where they designed and built the first generation of Compton scatter cameras. Yanfeng holds multiple degrees, including a Ph.D. in Radiation Measurement and Imaging from the University of Michigan and an M.S. in Nuclear Physics from the China Institute of Atomic Energy.
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