Peter Basa

Peter Basa is an experienced professional in the field of optical metrology, currently serving as the Deputy Manager of the Optical Division and Product Manager for Optical Thickness Metrology at Semilab Zrt since September 2010. Responsibilities include managing optical thin film thickness metrology for solar and semiconductor research and development, as well as characterizing semiconductor and dielectric materials. Prior to this role, Peter Basa worked as an Application Engineer, focusing on customer demonstrations and validation of optical metrology tools. Before joining Semilab Zrt, Peter Basa was a Research Fellow at the Institute for Technical Physics and Materials Science, where work concentrated on the electrical and optical characterization of semiconductor nanocrystals and measurement techniques for MEMS devices and sensor elements. Educational qualifications include a Ph.D. in Physics and an M.Sc. in Engineering Physics from the Budapest University of Technology and Economics.