Signal Integrity Journal (SIJ), a sister publication to Microwave Journal, covers signal integrity, power integrity and EMC/EMI related topics with industry news, technical articles, white papers, products, Buyer’s Guide, webinars, videos and more. SIJ is the only peer reviewed, industry journal covering these markets. It began as a website, www.signalintegrityjournal.com, and added the publication of a magazine in 2017. A distinguished Editorial Advisory Board (EAB), https://www.signalintegrityjournal.com/articles/651-sij-editorial-advisory-board assists the editorial staff in the article review process and generation of quality content.

Editor:
Patrick Hindle, Media Director at Microwave Journal & Signal Integrity Journal

Technical Editor:
Eric Bogatin, Professor, University of Colorado, Boulder in the ECEE dept and Teledyne LeCroy Fellow


Editorial Advisory Board (EAB):
Rula Bakleh, AMD
Benjamin Dannan, Signal Edge Solutions
Jay Diepenbrock, SI/RF Consultant
Vladimir Dmitriev-Zdorov, Mentor Graphics
Jason Ellison, TE Connectivity
HeeSoo Lee, Keysight 
Barry Katz, MathWorks
Cathy Liu, Broadcom
Alfred Neves, Wildriver Technology
Istvan Novak, Samtec
Prashant Pappu, Amazon
Steve Sandler, Picotest
Yuriy Shlepnev, Simberian Inc.
Bert Simonovich, LAMSIM Enterprises
Stephen Slater, Keysight
Mark Steffka, Retired Faculty of University of Detroit Mercy
Stephen Slater, Keysight Technologies
Larry Smith, Micron
Michael Violette, Washington Laboratories

Learn more here: https://www.signalintegrityjournal.com/aboutus

Signal Integrity Journal

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