Thomas Hager

Thomas Hager is an experienced professional in the field of metrology and engineering, currently serving as the Team Manager for Metrology Crystal Inspection at Siltronic AG since June 2019. Previously, Thomas worked at OSRAM from January 2011 to May 2019 in various roles including Senior Test Engineer and Product Development Engineer, focusing on product development and project management. Thomas's academic credentials include a Doctorate in Semiconductor Physics from The Philipp University of Marburg and a Diplom in Physics from the Technical University of Munich. Early career experiences include positions as a Doctoral Researcher at the Walter Schottky Institute and internships at Krauss Maffei Corporation and DRÄXLMAIER Group.