Barsha Jain

Barsha Jain is a Quality and Reliability Engineer at Solidigm since January 2022, where key responsibilities include investigating radiation effects on solid-state drives and ensuring the quality and reliability of integrated circuits and NAND components. Prior experience includes roles as a Quality and Reliability Engineering Graduate Intern at Intel Corporation and a Research Assistant at New Jersey Institute of Technology. Barsha has served as an instructor and teaching assistant for various engineering courses, providing support in embedded systems and microprocessor design. Educational qualifications include a PhD in Electrical Engineering from New Jersey Institute of Technology, an M.Tech. in VLSI Design from ABV-Indian Institute of Information Technology and Management, and a B.Tech. in Electronics and Communications Engineering from Biju Patnaik University of Technology.