Geoff Bennett, PhD, currently serves as Principal Engineer at Solidigm, leading technical management in component integration, failure analysis, and data science. Prior to this role, Bennett held positions including Director of Media Integration at SK hynix and Media Architecture and Integration Manager at Intel Corporation, where significant contributions included technology development for 3D floating gate flash memory and the deployment of advanced analytics tools. Previous experience also includes roles at Vanderbilt University as a Graduate Assistant focusing on radiation effects and reliability in microelectronics, and an internship at Intel Corporation that concentrated on quality assurance and reliability. Bennett holds a PhD and a Master's degree in Electrical and Electronics Engineering from Vanderbilt University, as well as a Bachelor’s degree in Electrical Engineering from Tennessee Technological University.
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