Bruno Moio is a Senior Failure Analysis Engineer at STMicroelectronics, where they specialize in root cause analysis, data-driven investigations, and yield loss reduction. Currently pursuing a PhD at Politecnico di Milano, they work in a state-of-the-art laboratory focused on ultrafast spectroscopy. With a strong background in optics, photonics, and experience in semiconductor manufacturing and R&D, Bruno employs analytical rigor and cross-functional collaboration to enhance manufacturing robustness and quality. They hold multiple degrees from Politecnico di Milano, including a Bachelor's degree and a Master's degree in Engineering Physics, as well as a PhD in Physics, all earned with honors.
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