Cheikh Diouf is a PhD and a team manager specializing in device characterization and reliability at STMicroelectronics. They previously worked as a reliability engineer at CEA-LETI and held internships focused on the characterization of high electron mobility transistors and transistors with deca-nanometric dimensions. Cheikh earned a Diplome d'ingénieur in research master’s in photonic physics, materials, and nanotechnologies from the Institut national des sciences appliquées (INSA) de Rennes.
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