Gilles Gasiot is a Principal Engineer specializing in radiation effect modeling and hardening, with over 25 years of experience in soft error rate characterization for decananometric CMOS processes and technology hardening for various environments. Currently, Gilles works at STMicroelectronics, where they serve as a Senior Member of the Technical Staff and have coauthored more than 100 articles while holding 10 patents in radiation hardening. Gilles has also contributed to the field as a session chairman and short course instructor for the NSREC conference. They completed a Ph.D. in Microelectronics at Université Bordeaux I, financed by STMicroelectronics, and gained initial experience as a trainee in the Radiation Effect Group at Vanderbilt University.
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