Guillaume JULLIEN

Guillaume JULLIEN has a solid background in engineering with expertise in lithography and defectivity within the semiconductor industry. From April 2008 to December 2009, Guillaume worked at CEA - Commissariat à l'énergie atomique et aux énergies alternatives as an Ingénieur en Lithographie, focusing on the implementation of monitoring for lithography equipment and process optimization. Subsequently, in early 2010, a brief tenure at STMicroelectronics involved engendering a defectivity program for inline product controls and developing scattering measurement processes, including model creation. Guillaume's educational foundation includes a Licence and Maîtrise in inorganic materials and semiconductor physics from IUP Genie Materiaux, a DUT in physical measurements from IUT d'Aix-Marseille, and a Master 2 professionnel in Micro-electronics and modeling.