Hina Mushir is a seasoned technical leader with over 25 years of experience in logic scan diagnostics, focusing on yield enhancement and defect isolation across various technology nodes. Hina has worked at STMicroelectronics since 1999, where they progressed from Senior Staff Engineer to Principal Engineer, providing expertise in logic diagnosis, silicon validation, and test methodologies. Hina is skilled in implementing diagnostic analysis and generating test patterns, contributing to the improvement of product yields and quality in collaboration with multiple teams and foundries.
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