Marco Bigi is a Physical Laboratory Maintenance & Infrastructure Manager at STMicroelectronics, recognized as a semiconductor devices metrology expert specializing in Electron Microscopy, Focused Ion Beam, semiconductor in-line metrology, and data analysis. They previously held leadership positions as a TEM Sample Preparation Group Leader at both Micron Technology and Numonyx, and contributed as a Senior Metrology Engineer at STMicroelectronics. Marco's academic credentials include a PhD in Elementary Particle Physics from the Università degli Studi di Torino and a degree in the same field from the Università degli Studi di Milano. Their diverse experience in the semiconductor industry and academia demonstrates a deep commitment to advancing metrology practices.
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