Pasquale Libutti is a seasoned professional with 25 years of experience in Non-Volatile Memory. They served as a Senior QRA Engineer at Micron Technology from 2010 to 2014, where they qualified new technologies and collaborated with various teams to analyze product failures. Prior to that, they worked as a Quality Reliability Engineer at Numonyx from 2008 to 2010, focusing on the qualification of NOR memory. Their extensive career began at STMicroelectronics, where they held the position of Device Engineer from 1990 to 2008 and contributed to the electrical characterization and industrialization of memory technologies. Currently, they are a Techn. Dev. Eng at STMicroelectronics.
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