Patrick Joubin is a Senior Engineer at STMicroelectronics, where they have been a leader on the defectivity team since 2011, managing a group of process engineers and technicians while overseeing multiple projects and collaborations. From 2000 to 2003, Patrick served as a metrology engineer, specializing in the monitoring of chemical contamination in semiconductor production. They hold a degree in Génie Physique with a focus on semiconductors and optoelectronics from the Institut national des sciences appliquées de Rennes, obtained between 1997 and 2000.
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