Simon Ribeyron is an Industrial Test Engineer at STMicroelectronics in the Imaging Division, a position held since September 2018. Previously, Simon has served as a Characterization Engineer at X-REL Semiconductor since September 2013, focusing on the development of characterization and production solutions for high-temperature and high-reliability ASICs. Simon began professional training as an analog and mixed-signal test engineer at ST-Ericsson from September 2010 to September 2013, with additional experience in industrializing new test solutions during an internship in 2012. Simon holds an Engineer's degree in Electrical and Electronics Engineering from Polytech Grenoble (2010-2013) and a University Technology Diploma in Electrical Engineering and Industrial Computing from Université Jean Monnet Saint-Etienne (2008-2010).
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