Ben Han

Ben Han is currently the President of the Memory Test Division at Teradyne, where they lead efforts in advancing semiconductor test solutions for DRAM and NAND technologies, focusing on High Bandwidth Memory to support the industry's evolution in the AI era. Ben has held significant roles throughout their career, including Vice President at Mattson Technology and Country Manager at Cabot Microelectronics, where they successfully established key partnerships and increased sales. Earlier, Ben worked at Daewoo Electronics as a Process Engineer and contributed to revenue growth at Applied Materials. Ben earned a Bachelor of Science in Metallurgical Engineering from Yonsei University.