Tom Vance

Tom Vance is an experienced ATE Applications Engineer at Teradyne since 2005, specializing in high-speed digital and mixed-signal IC test solutions. Prior to Teradyne, Tom worked as a Senior Staff Test Engineer at Cirrus Logic from 1994 to 2005, where responsibilities included test development and strategy for mixed-signal, DSP, video, and audio products. Earlier experience includes a role as a Test Engineer at IBM from 1989 to 1994, focused on test solutions for Personal Computers and RS6000 workstations, and at General Dynamics from 1985 to 1988, where Tom was responsible for test equipment for F16 aircraft weapon systems. Tom holds a Bachelor of Science in Electrical Engineering from Texas A&M University, earned between 1981 and 1985.