Aaron Dries is currently a Senior Yield Engineer at Texas Instruments, where they are responsible for process targeting, Cpk improvement, and root cause analysis related to electrical characteristics. Previously, they served as a Senior Device Engineer at National Semiconductor from 2003 to 2007, focusing on process targeting and leading teams in Six Sigma initiatives. Aaron holds a Bachelor of Science in Chemical Engineering from the University of Maine and a Masters of Engineering in Microelectronics Manufacturing Engineering from the Rochester Institute of Technology.
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