Bruce Turner is an experienced engineering professional with a focus on test engineering and yield improvement. Currently serving as the Probe Engineering Section Head at Texas Instruments since February 2010, Bruce has previously held key positions at Cypress Semiconductor, including Test Engineering Manager and Senior Staff Test Engineer, where responsibilities included managing a production test floor and supporting multiple test cells. Bruce's earlier role as Senior Yield Engineer involved enhancing die yield for various process flows. Bruce holds a Master of Science in Physics from Rensselaer Polytechnic Institute and a Bachelor of Arts in Physics from Brandeis University.
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