Cathy Chi is a highly experienced Mixed Signal and RF Characterization Engineer at Texas Instruments, where since February 2006, responsibilities have included post-silicon characterization for integrated wireless transceivers, defining test plans, and leading system integration efforts. Key achievements encompass the development of test methodologies, automation using LabView and Teststand, and collaboration with design and firmware teams to troubleshoot and optimize performance. Prior experience as a Process Engineer at Intel Corporation involved identifying defects and improving processes. Cathy Chi holds a PhD in Electrical Engineering from The University of Mississippi and a Master's degree from Shanghai Jiao Tong University.
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