Corey Goodrich

Corey Goodrich possesses extensive experience in the semiconductor industry, particularly at Texas Instruments, where employment spanned from 2000 to 2012. As a Design for Test (DFT) Engineer, Corey led the silicon bring-up for critical projects, addressed high-visibility customer quality issues, and facilitated collaboration between DFT and Product Engineering teams. Expertise includes silicon debug, fault isolation methodology development, and ensuring zero defective parts per million (DPPM) standards for automotive mixed-signal devices. Corey's educational background includes a B.S. in Physics from LSU Shreveport and an MS in Electrical Engineering focused on Microelectronics Design from The University of Texas at Dallas.