Corey Lewis is a business-driven engineering leader with over 20 years of experience in the semiconductor industry. Currently serving as Quality Director for Reliability and Device Analysis at Texas Instruments, Corey leads teams responsible for qualifications, reliability, and failure analysis in wafer manufacturing and assembly operations. Corey’s previous roles at Texas Instruments included Engineering Manager and WW Director of Device Analysis, showcasing a strong track record in operational management and quality assurance. Corey holds a Master’s degree in Electrical and Electronics Engineering from Rensselaer Polytechnic Institute and a Bachelor’s degree from Worcester Polytechnic Institute.
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