Jeff Roubik is the Director of Reliability Operations-Battery Monitor Products at Texas Instruments, bringing over 32 years of expertise in semiconductor wafer fabrication, bump, and assembly/test operations. They began their career as an Engineering Intern at Allied Signal in 1991 and have held various leadership roles at Texas Instruments, including Custom Automotive Engineering Manager and Automotive Quality Account Manager. Roubik has contributed to numerous initiatives aimed at process optimization and quality improvement across multiple wafer fabs and has led cross-functional teams to enhance product reliability. They hold a B.S. and M.S. in Materials Science and Engineering from the University of Illinois Urbana-Champaign.
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