John West has over 36 years of experience in the semiconductor industry, with a significant tenure at Texas Instruments spanning from 1985 to the present. In various roles including Failure Analysis/Debug Engineer and Manager, John has specialized in electrical failure analysis, debugging, and yield enhancement for products such as OMAP and Automotive MCUs. Prior experience includes managing wireless failure analysis and circuit design repair teams, as well as roles in wafer fabrication and ASIC quality engineering. John's early career included product engineering roles at Cyrix and Texas Instruments, where comprehensive testing and characterization of processors were conducted. John holds a Bachelor of Science in Microelectronic Engineering from the Rochester Institute of Technology.
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