Ping Jiang is a seasoned professional in the field of engineering, currently serving as the Director of Characterization-Reliability-SPICE Modeling Development. They have extensive experience in reliability and process development for both Analog and CMOS technologies. Previous positions include Senior Engineer at ION Geophysical, Manager of Reliability Qualification, and Director of Reliability Development at Texas Instruments. Jiang earned a Ph.D. in Chemical Engineering from the University of Houston from 1989 to 1994.
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