Xiaofeng Yu is a Senior Failure Analysis Engineer at Texas Instruments, where they conduct test and failure analysis for customer returns in the Asia region. Previously, they served as a Senior Test Validation/Failure Analysis Engineer at Intel Product (Shanghai) Ltd from 2002 to 2009, contributing to test validation and addressing product quality issues. Xiaofeng earned a Master's degree in Electrical Engineering from the Beijing Institute of Technology, completing their studies in 2002.
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