TMC Technologies
Joan Ruscin is a seasoned professional with extensive experience in quality assurance and testing within the technology sector. Currently serving as a Senior Test Engineer at TMC Technologies of WV since August 2015, Joan oversees complex biometrics testing programs for the FBI's CJIS NGI initiative. Additionally, Joan has been a Senior QA Analyst and Senior Consultant at DSD Labs since January 2010, excelling in assessing product specifications and ensuring comprehensive testing meets both business and end-user requirements. Previously, Joan held the position of Requirements Manager/Test Manager at SAIC from February 1995 to December 2009, demonstrating expertise in object-oriented design and the agile software process across various projects. Joan is an alumnus of The University of Akron.
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