Kai Wu is an optical system developer with over 10 years of dedicated research in optical measurement systems and over 3 years of experience in high-stress, fast-paced semiconductor manufacturing. Currently serving as a Principal Engineer at TSMC, they lead overlay measurement target design projects, manage scanner alignment target designs, and teach thin film metrology. Kai has also held positions as a Postdoctoral Associate at National Central University and as a Visiting Scholar at The University of Arizona. They earned a Ph.D. in Optics/Optical Sciences and a Master's degree from National Central University, as well as a Bachelor's degree in Physics from National Tsing Hua University.
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