光中 李 is a Senior Process Integration Engineer at United Microelectronics Corporation (UMC), specializing in RFSOI mass production. With over 8 years of manufacturing and R&D experience, they initially focused on DRAM research and development in Taiwan and China, where they developed skills in defect detection, overlay methods, and process improvement. Prior to their current role, 光中 held positions as a Senior Defect Management Engineer and Defect Management Engineer at 華邦電子 and other firms, contributing significantly to various DRAM projects. They hold both a Master's and Bachelor's degree in Materials Science from 國立交通大學.
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