Yu Te Lee

Yu Te Lee is an experienced engineer specializing in failure analysis, currently serving as a Senior Engineer in the Failure Analysis Department at United Microelectronics Corporation (UMC) since May 2012. In this role, Yu Te Lee contributes to the development of new 14nm FinFet processes by defining failure modes, conducting root cause analysis for wafer-level issues, and performing nano-probing measurements for device and SRAM debugging. Previous experience includes positions as a Failure Analysis Engineer at Integrated Service Technology, where consulting on IC FA project integration services and operating FIB/nanoprobing tools, and as an Integrate Engineer at Innolux Corporation in the Color Filter Department. Academic qualifications include a Master's Degree in Physical Sciences from National Dong Hwa University and a Bachelor's degree in Physical Sciences from Soochow University.