Jon Meyers

Jon Meyers is a dedicated research scientist currently engaged at Wolfspeed Materials R&D, where they focus on advancing the efficiency and quality of crystal growth processes in silicon carbide technology. With a background in physical chemistry and materials science, Jon previously served as a graduate research assistant at the University of North Carolina at Chapel Hill, where they led significant projects related to perovskite materials. Their journey in research also includes internships and roles at the Leibniz Institute of Surface Engineering and BYU-Idaho, where they contributed to diverse projects and honed their teaching and technical consulting skills. Jon holds a PhD in Physical Chemistry from the University of North Carolina at Chapel Hill and a BS in Chemistry from Brigham Young University - Idaho, both achieved with outstanding academic performance.