Kiho Kang

Kiho Kang has extensive experience in the semiconductor industry, currently serving as Senior Manager of R&D Test Engineering for Power Die PL at Wolfspeed since June 2013, overseeing on-wafer and bare-die production test systems for SiC Power Product Line. Previously, Kiho held positions as Senior Test Engineer at RFMD, focusing on wafer-level test capabilities for GaAs products, and as Quality Manager at Qimonda, managing quality support and process improvements. Earlier roles include Characterization and High-Speed Memory Test Engineer at Qimonda, and digital design positions at Ericsson. Kiho holds a Master’s and a Bachelor’s degree in Computer Engineering from North Carolina State University.