Ben J Eapen

Ben J Eapen is a Senior Director of Product Quality & Reliability at AMD, with extensive experience in the semiconductors industry. Previously, Ben held multiple leadership roles at Intel Corporation, including Senior Q&R Director for NAND Technology & Product Development and Director of Product Reliability Services. Ben developed numerous statistical models to optimize product performance and received the Intel Achievement Award for contributions to burn-in technology. Ben earned a B.Tech in Electrical Engineering from the University of Kerala and a Master’s degree from the University of New Mexico, where they also served as a Research Assistant focusing on optoelectronic devices.