Alif Semiconductor
Tien Cao is an experienced engineering professional specializing in test development for semiconductor solutions, currently serving as a Principal Test Development Engineer at Alif Semiconductor since October 2020, focusing on ATE test solutions for LTE RF connectivity SoCs in IoT applications. Prior roles include Test Development Engineer positions at GOODIX Technology INC. and Semtech, where Tien developed ATE test solutions for BLE RF connectivity and high-speed optical devices. Tien has also contributed to Microchip Technology, Semtech Corporation, ClariPhy Communications, Hi-Tech Solutions Group, Newport Media, Teridian Semiconductor Corp, and Skyworks Solutions, with expertise in diverse ATE platforms such as Advantest and Teradyne. Tien holds a degree from California State Polytechnic University-Pomona.
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