Ron Burnett

Ron Burnett Ph.D has extensive work experience in the field of software testing and engineering. Ron currently holds the position of Principal Software Test Engineer at Allegro MicroSystems since May 2022. Prior to this, they served as a Test Manager at NXP Semiconductors from March 2015 to May 2022 and at Athena Smartcard from September 2014 to March 2015. Ron also worked as a Test Engineer at Pure LiFi from January 2014 to September 2014. Ron has a background in flash memory controller firmware validation, having held the role of Staff Test Engineer at SanDisk from July 2013 to January 2014. Before that, Ron worked as a Senior Validation Test Development Engineer at INSIDE Secure from October 2010 to July 2013 and at Atmel Corporation from January 2000 to September 2010. Ron started their career as a Software Engineer at Geolink (UK) Ltd from October 1996 to December 1998, where they worked on Measurement While Drilling applications and Windows MFC applications.

Ron Burnett Ph.D has a diverse education history. Ron earned their Ph.D. in Electrical and Electronics Engineering from The Robert Gordon University in 1996, with a focus on "Transient Current Analysis for Fault Detection in Large Induction Motors." Prior to that, they completed their BEng (Hons) in Electronic and Electrical Engineering from Robert Gordons Institute of Technology in 1990. In 2007, they obtained an ILM Diploma in Management from Motherwell College. Ron also completed various management programs at Motherwell College, including an ILM Award in 1st Line Management, ILM SVQ in Management (Level 3), and a CFA Modern Apprenticeship in Management between 2011 and 2012. Furthermore, they attended Summerhill Academy in Aberdeen from 1980 to 1986.