Adam Ge is a metrology enthusiast and a Technical Project Manager with 12 years of experience in memory and logic patterning process control and image-based metrology within the semiconductor industry. Adam's career at Applied Materials began as a Product Specialist, leading to roles such as Application Engineer, Technical Program Manager, and Application Lead. Currently, Adam serves as the Director of Application Development, continuing their dedication to advancing metrology practices. Adam earned a Master’s degree in Materials Engineering from the Harbin Institute of Technology.
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