Fabien Perez is a Principal Test Engineer at Arm, specializing in the validation and characterization of SRAM and NVM on test chips. Previously, Fabien held various engineering roles at ST-Ericsson, NXP Semiconductors, Atmel, and Philips, where they focused on test development, product quality, and reliability across multiple technologies. Fabien's expertise includes developing test programs and tools for both embedded and non-volatile memory, contributing to improved processes and product yield. They earned their education at the Institut national des Sciences appliquées de Toulouse from 1992 to 1995.
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