Bram ter Huurne is an experienced Metrology Engineer at ASML with a background in AI and Computer Vision Engineeing at DEMCON Focal. Previous roles include Graduate Research Intern at Philips and teaching positions at Twente Academy, where Bram developed and taught a Masterclass in Nanotechnology. Bram also gained recognition as a Technology Scholar at ASML, showcasing expertise in advanced technology applications.
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