Martijn Schaafsma is a Principal Metrology Architect with a strong background in photonics, computational physics, and quantum mechanics. They earned an MSc in Applied Physics from Technische Universiteit Delft and a Doctorate in Nanophotonics from Technische Universiteit Eindhoven. Martijn's professional journey includes roles as a PhD student at AMOLF, intern in Nanowire Photonics, and various architect positions at ASML, where they focused on image quality and sub-functions. They also contributed as a Treasurer for the student union C.S.R. Delft and were a member of the Bright Society, guiding young academics in their early careers.
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