Zoi Dardani is a Wafer Metrology Architect at ASML, having previously held roles as a Wafer Metrology Design Engineer and Lithography System Performance Engineer. Zoi was a researcher at the Lab for Thin Films, focusing on the fabrication of polymeric nanofibers and nanoparticles, and gained expertise in antimicrobial testing and material characterization techniques. Additionally, Zoi provided tutoring services for university students in physics from 2014 to 2018. Zoi earned both a Bachelor's and a Master's degree in Physics and Nanotechnology from Aristotle University of Thessaloniki.
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