Denis Laffin

Denis Laffin has over 25 years of experience in the semiconductor industry, currently serving as a Senior Test & Product Engineer at EM Microelectronic since 2010, where significant improvements in RFID product yields were achieved through innovative testing methodologies and collaboration with Asian Wafer Foundry. Previously, from 1997 to 2009, Denis worked at STMicroelectronics as a Test, Product & Device Engineer, successfully introducing a CMOS technology line and dramatically reducing manufacturing hold rates. Educational qualifications include a Master's degree in Electrical and Electronics Engineering from ENIB and a Six Sigma Green Belt Certificate from OMNEX, highlighting expertise in engineering and statistics.