Johannes Glaab is a researcher and group lead at the Optoelectronics Reliability Lab within the Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik since June 2020. Prior to this role, Johannes served as a PhD student at the same institution from September 2010 to October 2019, focusing on a dissertation titled "Investigation of the degradation of InAlGaN-based ultraviolet light-emitting diodes for enhanced reliability." Johannes also worked as a research assistant, coordinating and contributing to projects such as the BMBF project “NanoPurification” and the KMU-innovativ project “UV-LEDIS.” Academic credentials include a Ph.D. in Electrical Engineering from Technische Universität Berlin, a Master of Engineering in Electrical Engineering and Electronics from TH Aschaffenburg University of Applied Sciences, and a Diplom-Ingenieur (Dipl.Ing.) in Industrial Engineering with a focus on Electrical Engineering from TH Aschaffenburg University.