PJ Chen is a Technologist at Western Digital, actively working on the sensor team. They have extensive experience in research and development, particularly in thin film materials and novel electronic devices, with a focus on magnetic tunnel junction devices and related technologies. Previously, PJ served as a Guest Research Scientist at NIST from 1996 to 2017 and is currently a Principal Research Scientist at Theiss Research Inc. PJ is pursuing multiple advanced degrees in Computer Science, Electrical and Electronics Engineering, and Materials Science from The George Washington University and Northeastern University.
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