Kaiyang Niu

Kaiyang Niu is a seasoned materials scientist with extensive experience in wafer characterization and catalyst development. Currently serving as the Sr. Manager of the Wafer Characterization Department at Headway Technologies, Kaiyang Niu leads a team of experts in Electron Microscopy, Advanced Metrology, and Materials Science. Previous roles include managing comprehensive wafer metrology at Headway, as well as significant contributions to catalyst development projects at the University of California, Berkeley, where Kaiyang Niu utilized advanced characterization techniques. With a Ph.D. in Materials Sciences from Tianjin University and early experience at Motorola (China) Electronics Co., Kaiyang Niu expertly combines academic and industrial knowledge to drive innovation in materials research.