Joan Sanchez Rallo

Joan Sanchez Rallo is an experienced professional in reliability engineering with a strong background in automotive systems and parts testing. Currently, Joan works at IDNEO, serving as a Reliability Engineer since June 2018. Previously, from January 2011 to June 2018, Joan held the position of Test Leader at FICOSA-Idneo, responsible for the design, implementation, and reporting of reliability validation plans. Prior to that, Joan worked as a Reliability Test Leader at SONY from September 2005 to December 2010. Joan holds an Ingeniero Técnico degree in Industrial Electronics and an Engineer's degree in Electrical and Electronics Engineering from Universitat Politècnica de Catalunya.