Gary Shade

Gary joined IAL in 2006 as a Senior Staff Engineer. He has 29 years experience in the semiconductor industry. He started his career as a Research Associate in semiconductor epitaxial growth and sub-micron GaAs wafer processing for both analog microwave and leading edge digital products. With his broad process background, Gary turned to Failure Analysis in 1988 and found his true passion. He joined the ISTFA Organizing committee where he has held every post and recently completed his term as Society president of EDFAS, the society for FA professionals. He has also led the Automotive Reliability Workshop and worked on analog and digital GaAs, Automotive ICs for Ford Motor, MEMS, and Leading edge ICs for Intel. He is familiar with all aspects of FA including new technique and tool development, and has contributed several papers and two invited tutorials to ISTFA. He holds two patents; one for analog GaAs and one for MEMs. Gary has taught classes on device physics and photoemission for undergraduate and graduate university students. He has also served as an expert witness on Photoemission Microscopy.