Thomas E. Paquette

Mr. Thomas Paquette's strong engineering background, combined with his broad business management experience, provides a unique customer-focused perspective. Tom is able to define complex technical issues, follow problems to root causes, and propose and implement innovative, yet pragmatic, solutions within rapidly changing markets. These abilities have consistently enhanced the organization's competitive positions.

Following his graduation from Clarkson University with a BSEE, Mr. Paquette joined the IIT Research Institute as a consultant. Upon completion of that DoD assignment, he held positions of increasing responsibility within Mostek, Honeywell, United Technologies, and Ford Microelectronics. In each environment, he was a key figure in establishing reliability and failure analysis facilities, designing reliability structures for both GaAs processes and printed circuit boards, setting industry standards for latch-up stressing, and influencing ESD standardization.