Khanh Luu

Khanh Luu is a seasoned engineer with over 30 years of experience in RF system integration, characterization, and testing, primarily at Intel Corporation since July 2011 as a Senior RF System Integration and Validation Engineer. Luu has a proven track record in leading RF PHY tests and characterizing Wi-Fi/BT products, earning two Division Recognition Awards for contributions to successful product launches. Previous roles include Senior RF Test and Characterization Engineer at Intel, Senior Staff RF Characterization Engineer at Telegent Systems, and multiple positions focused on ATE test development and characterization at companies such as TZero, Microlinear, Filtronic Solid State, CEL, and Samsung Microwave Semi. Luu holds a Bachelor’s degree in Electrical Engineering from Cogswell Polytechnical.