Jin Zhang, Ph.D., is currently a Senior Engineering Manager at Lam Research and serves as Co-Chair for the Frontiers in Characterization and Metrology for Nanoelectronics Conference (FCMN). With a Ph.D. in Materials Science from the University of Michigan, they have six years of experience with complex laser and optical systems, specializing in thin film and optical critical dimension metrology tools. Previously, they worked as a Senior Application Development Engineer at KLA-Tencor, where they provided customer support and developed testing protocols for metrology tools. Their research experience includes investigating organic nonlinear optical materials and conducting advanced optical experiments during their time as a Research Assistant at the University of Michigan.
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